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Effects of combined x-ray Irradiation and hot-electron injection on NMOS transistors

✍ Scribed by Artur Balasinski; Wenliang Chen; Tso-Ping Ma

Book ID: 112815104
Publisher: Springer US
Year: 1992
Tongue: English
Weight: 561 KB
Volume: 21
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02655604

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