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Effect of Direct Nitridation of 4H-SiC Surface on MOS Interface States

✍ Scribed by Sakai, Takashi; Hemmi, Mitsunori; Murata, Yusuke; Yamakami, Tomohiko; Hayashibe, Rinpei; Onuma, Yoshiharu; Kamimura, Kiichi

No coin nor oath required. For personal study only.

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