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Effect of annealing on GaN-insulator interfaces characterized by metal-insulator-semiconductor capacitors

✍ Scribed by Matocha, K.; Gutmann, R.J.; Chow, T.P.

Book ID: 114617118
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 349 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.813456

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