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Effects of interface states and temperature on the C-V behavior of metal/insulator/AlGaN/GaN heterostructure capacitors

✍ Scribed by Miczek, Marcin; Mizue, Chihoko; Hashizume, Tamotsu; Adamowicz, BogusÅawa

Book ID: 120791695
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 631 KB
Volume: 103
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2924334

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