Characterization and modeling of edge di
Characterization and modeling of edge direct tunneling (EDT) leakage in ultrathin gate oxide MOSFETs
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Yang, K.N.; Huang, H.T.; Chen, M.J.; Lin, Y.M.; Yu, M.C.; Jang, S.M.; Yu, D.C.H.
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Article
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2001
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IEEE
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English
โ 184 KB