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Edge hole direct tunneling leakage in ultrathin gate oxide p-channel MOSFETs

โœ Scribed by Kuo-Nan Yang; Huan-Tsung Huang; Ming-Jer Chen; Yeou-Ming Lin; Mo-Chiun Yu; Jang, S.S.A.; Yu, D.C.H.; Mong-Song Liang


Book ID
114538963
Publisher
IEEE
Year
2001
Tongue
English
Weight
153 KB
Volume
48
Category
Article
ISSN
0018-9383

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