✦ LIBER ✦
Enhanced Hole Gate Direct Tunneling Current in Process-Induced Uniaxial Compressive Stress p-MOSFETs
✍ Scribed by Chih-Yu Hsu; Chien-Chih Lee; Yi-Tang Lin; Chen-Yu Hsieh; Ming-Jer Chen
- Book ID
- 114619679
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 754 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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