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Drift hole mobility in strained and unstrained doped Si1-x Gex alloys

✍ Scribed by Manku, T.; McGregor, J.M.; Nathan, A.; Roulston, D.J.; Noel, J.-P.; Houghton, D.C.

Book ID: 114535247
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 711 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.239739

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