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Direct extraction of FET noise models from noise figure measurements

✍ Scribed by Rudolph, M.; Doerner, R.; Heymann, P.; Klapproth, L.; Bock, G.

Book ID
114554263
Publisher
IEEE
Year
2002
Tongue
English
Weight
101 KB
Volume
50
Category
Article
ISSN
0018-9480

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