Direct parameter-extraction method for MOSFET noise model from microwave noise figure measurement
β Scribed by Jianjun Gao
- Book ID
- 108271868
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 758 KB
- Volume
- 63
- Category
- Article
- ISSN
- 0038-1101
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## Abstract A fast and accurate method to determine the noise parameters of microwave FETs, based on a new expression of the device noise figure as a function of the __Y__βparameters and two equivalent noise temperatures, is presented. The method requires only the measured smallβsignal parameters a
## Abstract A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noiseβcorrelation matrix of an elemental section of the device from the device's noise figure, measured for only one sourceβimpedance state at a number of fre