✦ LIBER ✦

A method for the determination of a distributed FET noise model based on matched-source noise-figure measurements

✍ Scribed by M. C. Maya; A. Lázaro; L. Pradell

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 131 KB
Volume: 41
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.20099

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise‐correlation matrix of an elemental section of the device from the device's noise figure, measured for only one source‐impedance state at a number of frequency points. Experimental results up to 40 GHz are given. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 221–225, 2004; 2004; Published online in Wiley InterScience (www.interscience.wiley.com) DOI 10.1002/mop.20099

📜 SIMILAR VOLUMES

Accurate model of the source inductance

Accurate model of the source inductance to obtain the optimum noise figure for a high-gain LNA using source leads of a packaged device

✍ Harvinder S. Nagi 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 210 KB 👁 1 views

A practical approach based on a unilater

A practical approach based on a unilateral FET model for the design of a MMIC distributed amplifier

✍ Claudio Paoloni; Stefano D'Agostino 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 252 KB 👁 2 views

Figure 5 Convergence of the corrected diffraction coefficients f/')(w) to the exact pattern p,(w) of E = m as E increases from 2 to 1000 for 0, = 60", 8, = 300", and 0, = 330"