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Device noise in silicon RF technologies

โœ Scribed by Samuel Martin; Vance D. Archer III; David M. Boulin; Michel R. Frei; Kwok K. Ng; Ran-Hong Yan

Publisher
Institute of Electrical and Electronics Engineers
Year
2002
Tongue
English
Weight
222 KB
Volume
2
Category
Article
ISSN
1089-7089

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