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Characterization of burst noise in silicon devices

✍ Scribed by S.T. Hsu; R.J. Whittier

Publisher: Elsevier Science
Year: 1969
Tongue: English
Weight: 616 KB
Volume: 12
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(69)90044-6

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