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Determination of interface state density of PtSi/strained-Si1-xGex/Si Schottky diodes

✍ Scribed by S. Chattopadhyay; L. K. Bera; C. K. Maiti; S. K. Ray; P. K. Bose; D. Dentel; L. Kubler; J. L. Bischoff

Book ID
110270820
Publisher
Springer US
Year
1998
Tongue
English
Weight
267 KB
Volume
9
Category
Article
ISSN
0957-4522

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