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The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/n-Si schottky barrier diodes

✍ Scribed by E. Ayyildiz; Ç. Nuho Lu; A Türüt

Book ID: 107452824
Publisher: Springer US
Year: 2002
Tongue: English
Weight: 799 KB
Volume: 31
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-002-0157-9

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