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Determination of the Density Distribution of Interface States from High- and Low-Frequency Capacitance Characteristics of the Tin/Organic Pyronine-B/p-type Silicon Structure

✍ Scribed by Muzaffer Çakar; Cabir Temirci; Abdulmecit Türüt


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
95 KB
Volume
3
Category
Article
ISSN
1439-4235

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