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Aging effects on the interface state density obtained from current–voltage and capacitance–frequency characteristics of polypyrrole/p-Si/Al structure

✍ Scribed by M. Sağlam; A. Türüt


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
386 KB
Volume
101
Category
Article
ISSN
0021-8995

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