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The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

✍ Scribed by T. Kılıçoğlu; M.E. Aydın; Y.S. Ocak

Book ID: 108239480
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 159 KB
Volume: 388
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2006.06.126

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