𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of concentration depth-profiles by angle-dependent XPS and AES data

✍ Scribed by S.E. Borodyansky; Yu.G. Abashkin


Publisher
Elsevier Science
Year
1991
Weight
75 KB
Volume
251-252
Category
Article
ISSN
0167-2584

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Simulation study on regeneration of dept
✍ Ro, Chul-Un πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 308 KB πŸ‘ 1 views

This simulation study investigates the inΓ‘uences of sampling schemes, errors in the data and depth proÐling functions on the extraction of the depth proÐles from angle-resolved XPS data. An equiangular sampling scheme is more susceptible to the ill-posedness in the inverse operation of the Laplace t

Characterization of titanium hydride fil
✍ Lisowski, W.; van den Berg, A. H. J.; Leonard, D.; Mathieu, H. J. πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 98 KB πŸ‘ 2 views

Thin titanium hydride (TiH y ) films, covered by ultrathin gold layers, have been compared with the corresponding titanium films after analysis using a combination of time-of-flight SIMS (ToF-SIMS), XPS and AES. The TiH y layers were prepared under UHV conditions by precisely controlled hydrogen sor