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Investigation of concentration depth profiles by means of angle-resolved XPS: A polynomial model

โœ Scribed by M.G. Grabherr; H. Ebel; M.F. Ebel; R. Svagera; G. Baron


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
575 KB
Volume
63
Category
Article
ISSN
0368-2048

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