✦ LIBER ✦
Non-destructive concentration depth profiling of native-oxide/InP(100) samples by angle-resolved x-ray induced photoelectron spectroscopy: effect of annealing
✍ Scribed by J. Zemek; O.A. Baschenko; M.A. Tyzykhov
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 525 KB
- Volume
- 224
- Category
- Article
- ISSN
- 0040-6090
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