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Angle-resolved and depth profiling XPS investigation of a monolayer niobium oxide catalyst

✍ Scribed by F. Verpoort; G. De Doncker; A.R. Bossuyt; L. Fiermans; L. Verdonck

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 584 KB
Volume: 73
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(94)02290-9

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