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Quantitative analysis of AlxGa1-xAs/GaAs multiquantum wells by means of AES depth profiling and small area XPS

✍ Scribed by J. Olivier; G. Padeletti; G.M. Ingo; G. Mattogno; A. Bosacchi; S. Franchi


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
392 KB
Volume
70-71
Category
Article
ISSN
0169-4332

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