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Degradation of SiC-MESFETs by irradiation

✍ Scribed by H. Ohyama; K. Takakura; K. Uemura; K. Shigaki; T. Kudou; T. Matsumoto; M. Arai; S. Kuboyama; C. Kamezawa; E. Simoen; C. Claeys

Book ID
106397802
Publisher
Springer US
Year
2007
Tongue
English
Weight
250 KB
Volume
19
Category
Article
ISSN
0957-4522

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