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Deep level transient spectroscopy and TEM analysis of defects in Eu implanted GaN

✍ Scribed by A. Colder; T. Wojtowicz; P. Marie; P. Ruterana; V. Matias; M. Mamor; A. Vantomme; S. Eimer; L. Méchin

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 988 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200461504

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