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Critical layer thickness in MOCVD grown InGaAsGaAs strained quantum wells

✍ Scribed by Xiaobo Zhang; Olivier Briot; Bernard Gil; Roger Aulombard

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 275 KB
Volume: 35
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(95)01396-2

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