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Characterization of electrical and optical loss of MOCVD regrowth in strained layer InGaAs-GaAs quantum well heterostructure lasers

โœ Scribed by T.M. Cockerill; J. Honig; D.V. Forbes; K.J. Beernink; J.J. Coleman


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
433 KB
Volume
124
Category
Article
ISSN
0022-0248

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