Carbon nitride (CN x /CN x ) multilayers with sequential sp 3 -rich and sp 2 -rich layers were deposited on c-Si substrate by direct current magnetron sputtering. The composition, microstructure and morphology of the films were investigated by the X-ray photoelectron spectroscopy and transmission el
โฆ LIBER โฆ
Correlation between the microstructure and optical properties of carbon nitride films deposited by rf magnetron sputtering
โ Scribed by O. Durand-Drouhin; M. Lejeune; M. Clin; J. Henocque
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 194 KB
- Volume
- 4
- Category
- Article
- ISSN
- 1369-8001
No coin nor oath required. For personal study only.
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