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Construction of an adaptive scan network for test time and data volume reduction

✍ Scribed by Sinanoglu, O.

Book ID
117810017
Publisher
The Institution of Engineering and Technology
Year
2008
Tongue
English
Weight
327 KB
Volume
2
Category
Article
ISSN
1751-8601

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## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for non‐stuck‐at faults, such as del