Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction

✍ Scribed by Tsai, P.-C.; Wang, S.-J.

• Book ID: 117810037
• Publisher: The Institution of Engineering and Technology
• Year: 2008
• Tongue: English
• Weight: 304 KB
• Volume: 2
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt:20070115