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Concurrent application of compaction and compression for test time and data volume reduction in scan designs

✍ Scribed by Bayraktaroglu, I.; Orailoglu, A.

Book ID
118222165
Publisher
IEEE
Year
2003
Tongue
English
Weight
412 KB
Volume
52
Category
Article
ISSN
0018-9340

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## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for non‐stuck‐at faults, such as del