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Three-stage compression approach to reduce test data volume and testing time for IP cores in SOCs

โœ Scribed by Li, L.; Chakrabarty, K.; Kajihara, S.; Swaminathan, S.


Book ID
114448660
Publisher
The Institution of Electrical Engineers
Year
2005
Tongue
English
Weight
174 KB
Volume
152
Category
Article
ISSN
1350-2387

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