## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for nonβstuckβat faults, such as del
β¦ LIBER β¦
An application of acquisition and reduction of data of variable short-time tests
β Scribed by F. L. Schierloh; R. D. Chaney; S. J. Green
- Book ID
- 112732032
- Publisher
- Sage Publications
- Year
- 1970
- Tongue
- English
- Weight
- 722 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0014-4851
No coin nor oath required. For personal study only.
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