A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction

✍ Scribed by N. Badereddine; Z. Wang; P. Girard; K. Chakrabarty; A. Virazel; S. Pravossoudovitch; C. Landrault

• Publisher: Springer US
• Year: 2008
• Tongue: English
• Weight: 225 KB
• Volume: 24
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-007-5053-z