✦ LIBER ✦
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping
✍ Scribed by Bin Zhou; Li-yi Xiao; Yi-Zheng Ye; Xin-Chun Wu
- Publisher
- Springer US
- Year
- 2010
- Tongue
- English
- Weight
- 365 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0923-8174
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