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Comprehensive Understanding of Coulomb Scattering Mobility in Biaxially Strained-Si pMOSFETs

✍ Scribed by Yi Zhao; Takenaka, M.; Takagi, S.

Book ID: 114619573
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 446 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2015170

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