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On Surface Roughness Scattering-Limited Mobilities of Electrons and Holes in Biaxially Tensile-Strained Si MOSFETs

โœ Scribed by Yi Zhao, ; Takenaka, M.; Takagi, S.


Book ID
125805021
Publisher
IEEE
Year
2009
Tongue
English
Weight
270 KB
Volume
30
Category
Article
ISSN
0741-3106

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