✦ LIBER ✦
A Novel Characterization Scheme of Interface Roughness for Surface Roughness Scattering-Limited Mobilities of Electrons and Holes in Unstrained- and Strained-Si MOSFETs
✍ Scribed by Yi Zhao; Matsumoto, H.; Sato, T.; Koyama, S.; Takenaka, M.; Takagi, S.
- Book ID
- 114620069
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 971 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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