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Comparative study of defect energetics in HfO[sub 2] and SiO[sub 2]

✍ Scribed by Scopel, W. L.; da Silva, AntoÌnio J. R.; Orellana, W.; Fazzio, A.

Book ID: 121247853
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 368 KB
Volume: 84
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1650874

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