Charge Trapping in High- Gate Stacks Due to the Bilayer Structure Itself

✍ Scribed by Jameson, J.R.; Griffin, P.B.; Plummer, J.D.; Nishi, Y.

• Book ID: 114618345
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 482 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.877700