✦ LIBER ✦
Transient Charging and Discharging Behaviors of Border Traps in the Dual-Layer HfO2/SiO2 High- κ Gate Stack Observed by Using Low-Frequency Charge Pumping Method
✍ Scribed by Wei-Hao Wu; Bing-Yue Tsui; Mao-Chieh Chen; Yong-Tian Hou; Yin Jin; Tao, H.-J.; Shih-Chang Chen; Mong-Song Liang
- Book ID
- 114618732
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 415 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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