✦ LIBER ✦
A General and Reliable Model for Charge Pumping—Part II: Application to the Study of Traps in or in High- Gate Stacks
✍ Scribed by Bauza, D.
- Book ID
- 114619277
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 438 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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