Voltage shifts of Fowler-Nordheim tunneling J-V plots in thin gate oxide MOS structures due to trapped charges

✍ Scribed by S.J. Oh; Y.T. Yeow

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 400 KB
• Volume: 32
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(89)90035-x