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Charge trapping at Pt/high-k dielectric (Ta2O5) interface

✍ Scribed by L. Stojanovska-Georgievska; N. Novkovski; E. Atanassova

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 504 KB
Volume: 406
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.05.058

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