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Fixed charge and interface traps at heterovalent interfaces between Si(100) and non-crystalline Al2O3–Ta2O5 alloys

✍ Scribed by Robert S Johnson; Gerald Lucovsky; Joon Goo Hong


Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
176 KB
Volume
59
Category
Article
ISSN
0167-9317

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✦ Synopsis


Characterization by Auger electron spectroscopy, AES, and Fourier transformation infrared spectroscopy, FTIR, confirm that (Ta O ) (Al O ) alloys are homogeneous with pseudo-binary in character, and display increased thermal stability. 2 5 x 2 3 12x Capacitance-voltage, C-V, and current density-voltage, J-V, data as a function of temperate show that the Ta d-states of the alloys act as localized electron traps, and are at an energy approximately equal to the conduction band offset of Ta O with 2 5

respect to Si.