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Application of high-k dielectric stacks charge trapping for CMOS technology

✍ Scribed by Satinder K. Sharma; B. Prasad; Dinesh Kumar

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 802 KB
Volume: 166
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2009.11.002

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