Reliability of charge trapping memories with high-k control dielectrics (Invited Paper)

✍ Scribed by G. Molas; M. Bocquet; E. Vianello; L. Perniola; H. Grampeix; J.P. Colonna; L. Masarotto; F. Martin; P. Brianceau; M. Gély; C. Bongiorno; S. Lombardo; G. Pananakakis; G. Ghibaudo; B. De Salvo

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 979 KB
• Volume: 86
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2009.03.083