✦ LIBER ✦

Charge trapping and breakdown in thin SiO2 polysilicon-gate MOS capacitors

✍ Scribed by M. Dutoit; P. Fazan; A. Benjelloun; M. Ilegems; J.-M. Moret

Book ID: 107925613
Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 321 KB
Volume: 30
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(87)90110-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Charge generation in thin SiO2 polysilic

Charge generation in thin SiO2 polysilicon-gate MOS capacitors

✍ P. Fazan; M. Dutoit; C. Martin; M. Ilegems 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 578 KB

Charge Build up and Breakdown in Thin Si

Charge Build up and Breakdown in Thin Sio2 Gate Dielectrics

✍ Hillen, M.W.; De Keersmaecker, R.F.; Heyns, M.M.; Haywood, S.K.; Darakchiev, I.S 📂 Article 📅 1984 🏛 IEEE 🌐 English ⚖ 773 KB

Charge generation in thin SiO2 polysilic

Charge generation in thin SiO2 polysilicon-gate MOS capacitors : P. Fazan, M. Dutoit, C. Martin and M. Ilegems. Solid-St. Electron.30, 829 (1987)

📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 132 KB

Effect of nitridation on Fowler–Nordheim

Effect of nitridation on Fowler–Nordheim tunneling coefficients in SiO2MOS capacitors with WSi2-polysilicon gate

✍ S. Croci; C. Plossu; B. Balland; C. Dubois; P. Boivin 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 346 KB

Transients during pre-breakdown and hard

Transients during pre-breakdown and hard breakdown of thin gate oxides in metal–SiO2–Si capacitors

✍ S Lombardo; F Crupi; C Spinella; B Neri 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 939 KB

Time±resolved electrical measurements show transient phenomena occurring during degradation and intrinsic dielectric breakdown of gate oxide layers under constant voltage Fowler±Nordheim stress. We have studied such transients in metal/oxide/semiconductor (MOS) capacitors with an n + poly-crystallin

Positive charge trapping in thin gate ox

Positive charge trapping in thin gate oxides of MOS capacitors during constant current and voltage fowler-nordheim stress

✍ Samanta, Piyas ;Sarkar, C. K. 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 570 KB