Positive charge trapping in thin gate oxides of MOS capacitors during constant current and voltage fowler-nordheim stress

✍ Scribed by Samanta, Piyas ;Sarkar, C. K.

• Publisher: John Wiley and Sons
• Year: 1995
• Tongue: English
• Weight: 570 KB
• Volume: 151
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211510227