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Charge Build up and Breakdown in Thin Sio2 Gate Dielectrics

✍ Scribed by Hillen, M.W.; De Keersmaecker, R.F.; Heyns, M.M.; Haywood, S.K.; Darakchiev, I.S.

Book ID
114621814
Publisher
IEEE
Year
1984
Tongue
English
Weight
773 KB
Volume
EI-19
Category
Article
ISSN
0018-9367

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