๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterization of time-dependent dielectric breakdown in intrinsic thin SiO2

โœ Scribed by John S. Suehle; Prasad Chaparala


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
550 KB
Volume
27
Category
Article
ISSN
0026-2692

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES